WAVEPLATE SAPPHIRE

Showing all 19 results

    Catalog No. Description QOH Order
    SCD1965-01B
    WAVEPLATE SAPPHIRE 1/4 WAVE
    0.500"DIA .022"NOM THK 3.388um
    more info...

    SCD1965-01B

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.010″
    OD FLAT: NONE
    THICKNESS: 0.022″ NOMINAL TO YIELD RETARDATION TOL
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/1200 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 3.388 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES.

    6Register for Pricing
    SCD1970-01A
    WAVEPLATE SAPPHIRE 1/4 WAVE
    0.500"DIA .022"NOM THK 1.064um
    more info...

    SCD1970-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.005″
    OD FLAT: NONE
    THICKNESS: 0.022″ NOMINAL TO YIELD RETARDATION TOL
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/400 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 1.064 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES.

    20Register for Pricing
    SCD1971-01A
    WAVEPLATE SAPPHIRE 1/2 WAVE
    0.500"DIA .024"NOM THK 1.064um
    more info...

    SCD1971-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.005″
    OD FLAT: NONE
    THICKNESS: 0.024″ NOMINAL TO YIELD RETARDATION TOL
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/400 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 1.064 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES.

    8Register for Pricing
    SCD2073-01A
    WAVEPLATE SAPPHIRE 1/2 WV DB
    0.500"DIA.192"NOM THK1053/1556
    more info...

    SCD2073-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+/-.002″
    MARKING: SMALL OD FLAT INDICATING THE PROJECTION
    OF THE C-AXIS.
    THICKNESS: 0.192″ NOMINAL TO YIELD RETARDATION TOL
    EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 73/2 WAVES AT 1053 NANOMETERS.
    49/2 WAVES AT 1556 NANOMETERS.
    RETARDATION TOLERANCE: LAMBDA/350
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    LESS THAN 0.5% REFLECTANCE PER SURFACE
    AT BOTH 1053nm AND 1556nm WITH A NORMAL
    INCIDENCE ANGLE, APPLIED TO BOTH FACES.

    9Register for Pricing
    SCD2127-01A
    WAVEPLATE SAPPHIRE 1/2 EV DB
    0.500"DIA.107"NOM THK 532/732
    more info...

    SCD2127-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+/-.002″
    MARKING: SMALL OD FLAT INDICATING THE PROJECTION
    OF THE C-AXIS.
    THICKNESS: 0.107″ NOMINAL TO YIELD RETARDATION TOL
    EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 83/2 WAVES AT 532 NANOMETERS.
    59/2 WAVES AT 731.5 NANOMETERS.
    RETARDATION TOLERANCE: LAMBDA/300
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    LESS THAN 0.5% REFLECTANCE AT BOTH
    532nm AND 731.5nm WITH A NORMAL INCIDENCE
    ANGLE, APPLIED TO BOTH FACES.

    8Register for Pricing
    SCD2346-01A
    WAVEPLATE SAPPHIRE 1/2 WV DB
    0.500"DIA.102"NOM THK 532/803
    more info...

    SCD2346-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+/-.002″
    MARKING: SMALL OD FLAT INDICATING THE PROJECTION
    OF THE C-AXIS.
    THICKNESS: 0.102″NOM TO YIELD RETARDATION TOL
    EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 79/2 WAVES AT 532 NANOMETERS.
    51/2 WAVES AT 803 NANOMETERS.
    RETARDATION TOLERANCE: LAMBDA/300
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    LESS THAN 0.5% REFLECTANCE AT BOTH
    532nm AND 803nm WITH A NORMAL INCIDENCE
    ANGLE, APPLIED TO BOTH FACES.

    14Register for Pricing
    SCD2346-01B
    WAVEPLATE SAPPHIRE 1/2 WV DB
    0.667"DIA .102"NOM THK 532/803
    more info...

    SCD2346-01B

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.667″+/-.002″
    MARKING: SMALL OD FLAT INDICATING THE PROJECTION
    OF THE C-AXIS.
    THICKNESS: 0.101602″+/-.000012″
    EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 79/2 WAVES AT 532 NANOMETERS.
    51/2 WAVES AT 803 NANOMETERS.
    RETARDATION TOLERANCE: LAMBDA/300
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    LESS THAN 0.5% REFLECTANCE AT BOTH
    532nm AND 803nm WITH A NORMAL INCIDENCE
    ANGLE, APPLIED TO BOTH FACES.

    7Register for Pricing
    SCD2350-01A
    WAVEPLATE SAPPHIRE 1/4 WAVE
    70.0mm DIA 3.2mm NIM THK 3.726
    more info...

    SCD2350-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 70.00mm + 0.00mm /- 0.12mm
    MARKING: SMALL OD FLAT INDICATING THE PROJECTION
    OF THE C-AXIS.
    THICKNESS: 3.2mm NOMINAL TO YIELD RETARDATION TOL
    EDGE BEVEL: 0.13mm MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 25 LAMBDA/4
    RETARDATION TOLERANCE: LAMBDA/1000
    SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE COATING FOR 0.50% MAXIMUM
    REFLECTANCE PER SURFACE FROM 3.0 TO 5.0
    MICRONS WITH A NORMAL INCIDENCE ANGLE,
    APPLIED TO BOTH FACES.

    2Register for Pricing
    SCD2516-01B
    WAVEPLATE SAPPHIRE 1/4WV CTD
    20.0mm DIA .57mm NOM THK 3.388
    more info...

    SCD2516-01B

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 20.00mm + 0.00mm /- 0.20mm
    OD FLAT: NONE, NOT REQUIRED.
    THICKNESS: 0.022″ NOMINAL TO YIELD RETARDATION
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/1200 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR 0.25% R
    PER SURFACE AT 3.388 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES. COATING TO MEET ENVIRONMENTAL
    REQUIREMENTS OF MIL-PRF-13830B FOR
    HUMIDITY.

    1Register for Pricing
    SCD2535-01A
    WAVEPLATE SAPPHIRE 1/2WV MTD
    0.500"OD.25"THK.38"I.D 3.31um
    more info...

    SCD2535-01A

    1Register for Pricing
    SCD2571-02A
    WAVEPLATE SAPPHIRE 1/4 WAVE
    40.0mm DIA .037"NOM THK 805nm
    more info...

    SCD2571-02A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 40.00mm + 0.00mm /- 0.10mm
    THICKNESS: 0.037″ NOMINAL TO YIELD RETARDATION
    PARALLELISM: 2 ARC SECONDS MAXIMUM
    RETARDATION: 0.25 WAVES
    RETARDATION TOLERANCE: LAMBDA/100 AT 805nm
    TRANSMITTED WAVEFRONT ERROR: 1/10 WAVE MAXIMUM
    @ 0.633um.
    SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIRELFECTIVE COATED FOR MAXIMUM
    TRANSMISSION AT 805 NANOMETERS WITH A
    NORMAL +/- 12 DEGREE INCIDENCE ANGLE,
    APPLIED TO BOTH FACES.

    6Register for Pricing
    SCD2650-01A
    WAVEPLATE SAPPHIRE 1/4 WAVE
    0.500"DIA .027"NOM THK 3.90um
    more info...

    SCD2650-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.010″
    OD FLAT: 0.150″ NOMINAL WIDTH PERP. TO C-AXIS.
    THICKNESS: 0.027″ NOMINAL TO YIELD RETARDATION.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/1000 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 3.90 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES.

    4Register for Pricing
    SCD2719-01A
    WAVEPLATE SAPPHIRE 1/2 WAVE
    0.500"DIA .025"NOM THK 3.175um
    more info...

    SCD2719-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.010″
    OD FLAT: NONE
    THICKNESS: 0.025″ NOMINAL TO YIELD RETARDATION TOL
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
    RETARDATION TOLERANCE: +/- 1/1200 WAVE
    CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 3.175 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES.

    3Register for Pricing
    SCD2725-01A
    WAVEPLATE SAPPHIRE 1/2WV DB
    0.500"DIA.067"NOM THK1064/1550
    more info...

    SCD2725-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+/-.002″
    THICKNESS: 0.067″ NOMINAL TO YIELD RETARDATION TOL
    EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
    RETARDATION: 25/2 WAVES AT 1064 NANOMETERS.
    17/2 WAVES AT 1550 NANOMETERS.
    RETARDATION TOLERANCE: LAMBDA/150
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    < 0.5% R AT BOTH 1064nm AND 1551nm WITH A
    COATING DAMAGE THRESHOLD FOR 10-ns PULSES
    AT 100 Hz >5 J/cm FOR 1064 nm OPO PUMP
    AND 3 J/cm2 FOR 1551 OPO SIGNAL. COATING
    MUST SURVIVE LONG TERM OPERATION AT FULL
    POWER AT SPECIFIED FLUENCES AND
    REPETITION RATE.

    2Register for Pricing
    SCD2871-01A
    WAVEPLATE SAPPHIRE 1/4 WAVE
    12.0mm DIA .55mm NOM THK 1.319
    more info...

    SCD2871-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 12.00 +/- 0.05mm
    OD FLAT: 5.65mm FROM THE CENTER OF THE PART.
    THICKNESS: 0.55mm TO YIELD RETARDATION TOL.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 1/8 WAVE MAXIMUM AT 632.8nm OVER CA.
    RETARDATION TOLERANCE: +/- 1/500 WAVE
    CLEAR APERTURE: CENTRAL 10.50 mm OF DIAMETER.
    SURFACE FINISH: 40-20 PER MIL-PRF-13830, 2 FACES.
    MATERIAL TYPE/QULAITY: SAPPHIRE, OPTICAL GRADE,
    CSI HEMLITE ONLY.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
    TRANSMISSION AT 1.319 MICRONS WITH A
    NORMAL INCIDENCE ANGLE, APPLIED TO
    BOTH FACES. SEE DRAWING FOR TEST DATA
    REQUIRED.

    10Register for Pricing
    SCD2940-01A
    WAVEPLATE SAPPHIRE 1/2 WAVE
    1.000"DIA..027"NOM THK 3.338um
    more info...

    SCD2940-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 1.000″+.000″/-.005″
    OD FLAT: 0.375″ WIDTH PERP.TO C-AXIS PROJECTION.
    THICKNESS: 0.027″ TO YIELD RETARDATION TOLERANCE.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    T.W.E: 0.25 WAVE MAXIMUM AT 633nm OVER CA.
    RETARDATION: 0.50 WAVE +/- 0.01 WAVE AT 3.338um.
    CLEAR APERTURE: CENTRAL 0.800″ DIAMETER.
    SURFACE FINISH: 60-40 PER MIL-PRF-13830, 2 FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE,
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: ANTIREFLECTIVE COATED FOR 0.25% MAXIMUM
    REFLECTANCE PER SURFACE AT 3.338 MICRONS
    WITH A NORMAL INCIDENCE ANGLE, APPLIED
    TO BOTH FACES.

    1Register for Pricing
    SCD2963-01A
    WAVEPLATE SAPPHIRE 1/2 WAVE
    0.500"DIA.045"NOM THK1064/1627
    more info...

    SCD2963-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+/-.002″
    OD FLAT: PERPENDICULAR TO C-AXIS PROJECTION.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    THICKNESS: 0.045″ NOMINAL
    EDGE BEVEL: LIGHT PROTECTIVE BEVEL, 2 PLACES.
    RETARDATION: 17/2 WAVES AT 1.064 MICRONS.
    11/2 WAVES AT 1.627 MICRONS.
    RETARDATION TOLERANCE: LAMBDA/300 AT 1.672 MICRONS
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUALBAND ANTIREFLECTIVE COATING FOR
    LESS THAN 0.5% REFLECTANCE AT BOTH
    1.064 AND 1.627 MICRONS WITH A NORMAL
    INCIDENCE ANGLE, APPLIED TO BOTH FACES.

    3Register for Pricing
    SCD3242-01A
    WAVEPLATE SAPPHIRE DUAL CTD
    0.500"DIA X 0.061"NOMINAL THL.
    more info...

    SCD3242-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.010″
    OD FLAT: NONE, NOT REQUIRED.
    THICKNESS: 0.0614″ NOMINAL TO YIELD RETARDATION.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    TRANSMITTED WAVEFRONT: 1/10 WAVE MAXIMUM AT 633nm.
    RETARDATION TOLERANCE: +/- 1/300 WAVE
    SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
    CLEAR APERTURE: CENTRAL 0.375″ OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUAL-BAND ANTIREFLECTIVE COAT MAXIMUM
    TRANSMISSION AT BOTH 1064nm AND ALSO
    1595mm TO 1650nm WITH A NORMAL INCIDENCE
    ANGLE, APPLIED TO BOTH FACES.

    4Register for Pricing
    SCD3244-01A
    WAVEPLATE SAPPHIRE DUAL CTD
    0.500"DIA X 0.101"NOMINAL THK.
    more info...

    SCD3244-01A

    CONFIGURATION: DISC, PLANE-PARALLEL
    DIAMETER: 0.500″+.000″/-.010″
    OD FLAT: NONE, NOT REQUIRED.
    THICKNESS: 0.1005″ NOMINAL TO YIELD RETARDATION.
    PARALLELISM: 2 ARC SECONDS MAXIMUM.
    TRANSMITTED WAVEFRONT: 1/10 WAVE MAXIMUM AT 633nm.
    RETARDATION TOLERANCE: +/- 1/300 WAVE
    SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
    CLEAR APERTURE: CENTRAL 0.375″ OF DIAMETER FACES.
    MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
    CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
    COATING: DUAL-BAND ANTIREFLECTIVE COAT MAXIMUM
    TRANSMISSION AT BOTH 2090nm AND ALSO
    4600mm WITH A NORMAL INCIDENCE ANGLE,
    APPLIED TO BOTH FACES.

    3Register for Pricing