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6/29/2011  X-Ray Goniometry Orients Single-Crystal Materials 
 
An X-ray diffraction analysis service that employs X-ray goniometry to identify and document differences in the orientation of single-crystal materials has been introduced by Meller Optics, Inc. of Providence, Rhode Island.

Meller Optics’ X-Ray Goniometry Service measures a specific sample plane of a single-crystal material and provides a flat reference with accuracy on the order of 0.5-3 min. to assure more accurate outcomes of experiments. Suitable for samples from 0.25” sq. and up of materials such as sapphire, single-crystal quartz, silicon, MgF2, CaF2, BaF2, and spinel, the firm can also correct a plane and provide a reference flat, if desired.

Performing sample plane measurements per customer specification, Meller Optics’ X-Ray Goniometry Service is typically necessary to validate orientation when the thermal expansion, thermal coefficient and the index of refraction have to be the same in all directions; when birefringence must be maximum or minimum; when polarization effects are critical; and when the user is looking for a cleavage plane or wants to avoid one.

Meller Optics’ X-Ray Goniometry Service is priced from $150.00, depending upon customer requirements. Quotations are provided upon request.
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